Chapter 7: pn Junction Diode: Small-Signal Admittance

Note on the source: the OCR of this chapter is noisy. Where a symbol or exponent was lost I restored it from physics and cross-checks, and I say so when it matters. For example, the area of the 1N5472A is , because that is the value that reproduces the book’s quoted .

7.1 Introduction

Picture a diode sitting quietly at some DC operating point. Now tap it very gently: add a tiny sinusoidal voltage on top of the DC bias , and listen for the current that comes back, . This “tap and listen” experiment is the small-signal response. Because the tap is small (tens of millivolts or less), the diode answers linearly, and the whole answer is packaged in one complex number, the small-signal admittance

The junction region responds in two ways. It can store charge (a capacitor) and it can pass current (a conductor). So in general

\boxed{Y=G+j\omega C}\tag{7.1}

with and the angular frequency in rad/s.

Equivalent circuit. The circuit has a conductance in parallel with a capacitance (the junction admittance), in series with the series resistance of the contacts and quasineutral regions (introduced in Chapter 6). and both depend on the DC bias, which is why the book draws arrows through them. is normally tiny compared with the junction impedance except at large forward bias, so from here on we assume unless stated.

Plan of attack.

  1. Reverse bias: the conductance is tiny, so . Only majority carriers wiggle.
  2. Forward bias: conductance matters, and minority carriers join the dance, producing the diffusion admittance.

Analogy: a diode is like a drum. Under reverse bias you tap the drum skin (the depletion edges) and it flexes like a spring (capacitance). Under forward bias there is also a leaky pipe through it (conductance), and water sloshing in the pipe (minority carriers) lags behind your tapping when you tap fast.


7.2 Reverse-Bias Junction Capacitance

7.2.1 General Information

Under reverse bias the pn diode is functionally a capacitor. Many “capacitors” inside integrated circuits are really reverse-biased pn junctions. It differs from an ordinary capacitor in one striking way: its capacitance decreases monotonically as the reverse bias increases (the sample data in Fig. 7.3, from a 1N5472A abrupt-junction diode, fall from about 120 pF at 0 V to a few pF near V).

Thought experiment: what happens during one a.c. cycle? The total junction voltage is .

  • Positive half cycle (): the reverse bias is slightly reduced, the depletion width shrinks a little, so some charge is uncovered then removed from each side. A few majority carriers rush back toward the junction and neutralize edge charge.
  • Negative half cycle (): reverse bias increases, the depletion region widens, and more ionized dopants are uncovered on both sides.

So the depletion width breathes in and out around its DC value, and a charge density oscillation appears. Because is tiny, the is effectively a thin sheet of charge at one edge of the depletion region and a thin sheet of charge at the other, a distance apart. That is exactly a parallel-plate capacitor:

\boxed{C_J=\frac{K_S\varepsilon_0A}{W}}\tag{7.2}

The subscript means junction (or depletion-layer) capacitance. Under reverse bias since nothing else oscillates significantly. Since grows with reverse bias, falls, matching the experiment.

(Figure 7.4 shows (a) the depletion edge moving, (b) the step-junction charge density profile with edges shifting, (c) for , (d) for ; the plots are the shifted profile minus the DC profile.)

Quasistatic following. For the oscillation to happen, majority carriers must flow in and out of the quasineutral regions in sync with , responding as if were a DC bias. This is called following the signal quasistatically. Majority carrier response times in Si are about s or less (the dielectric relaxation time), so the quasistatic assumption is valid up to very high frequencies.

7.2.2 C-V Relationships

To get the exact versus we substitute the appropriate into (7.2). From Chapter 5:

W=\left[\frac{2K_S\varepsilon_0}{qN_B}(V_{bi}-V_A)\right]^{1/2}\quad\text{(asymmetrical step)}\tag{7.3}

W=\left[\frac{12K_S\varepsilon_0}{qa}(V_{bi}-V_A)\right]^{1/3}\quad\text{(linearly graded)}\tag{7.4}

where is the doping on the lightly doped side and is the grading constant. Rather than treat each separately, we generalize to a one-sided power-law profile: one side () heavily doped and the light side

N_B(x)=b\,x^{m},\qquad x>0\tag{7.5}

with and constants. Special cases: (step, ), (one-sided linearly graded), and (hyperabrupt: doping falls as you leave the junction; made by ion implantation or epitaxy). Fig. 7.5 shows (a) , a straight line rising from the origin, (b) , a flat line, (c) , a hyperbola falling away.

For the depletion width is

\boxed{W=\left[\frac{(m+2)K_S\varepsilon_0}{qb}(V_{bi}-V_A)\right]^{1/(m+2)}}\tag{7.6}

(This derivation is Problem 7.2; I derive it fully there.) Check: gives (7.3); with gives (7.4) (the "" accounts for the two-sided linear profile in the book’s (7.4) versus the one-sided one here).

Substituting (7.6) into (7.2):

\boxed{C_J=\frac{K_S\varepsilon_0A}{\left[\dfrac{(m+2)K_S\varepsilon_0}{qb}(V_{bi}-V_A)\right]^{1/(m+2)}}}\tag{7.7}

Define the zero-bias capacitance

C_{J0}=C_J\big|_{V_A=0}=\frac{K_S\varepsilon_0A}{\left[\dfrac{(m+2)K_S\varepsilon_0V_{bi}}{qb}\right]^{1/(m+2)}}\tag{7.8}

Dividing (7.7) by (7.8) the constants cancel:

\boxed{C_J=\frac{C_{J0}}{\left(1-\dfrac{V_A}{V_{bi}}\right)^{1/(m+2)}}}\tag{7.9}

Varactors. A diode built to exploit (7.7)/(7.9) is a varactor (“variable reactor”; reactance ). Uses: parametric amplification, harmonic generation, mixing, detection, voltage-variable tuning (think of the tuning knob of a radio being replaced by a voltage). The figure of merit is the tuning ratio

\mathrm{TR}=\frac{C_J(V_{A1})}{C_J(V_{A2})}=\left[\frac{V_{bi}-V_{A2}}{V_{bi}-V_{A1}}\right]^{1/(m+2)}\;\xrightarrow{\;|V_A|\gg V_{bi}\;}\;\left(\frac{V_{A2}}{V_{A1}}\right)^{1/(m+2)}\tag{7.10}

The exponent grows as becomes smaller, so TR increases going from linear (, exponent ) to step (, ) to hyperabrupt (, exponent ). That is why hyperabrupt varactors are commercially valuable: the capacitance changes most per volt.

Exercise 7.1: Normalized C-V curves

Problem. Compute and plot versus for the linearly graded, step, and hyperabrupt diodes, for , and comment.

Solution logic. Equation (7.9) in normalized form is with and , so for we have . These are “universal” curves: any one-sided power-law diode collapses onto one of them once axes are normalized. The code builds a matrix with one row per and plots all rows.

% Exercise 7.1 -- Normalized C-V curves
clear
m = [1 0 -1];            % linear, step, hyperabrupt
s = 1./(m+2);            % exponents 1/(m+2)
x = linspace(-25,0);     % x = VA/Vbi
y = [];                  % y = CJ/CJ0
for i = 1:3
    y = [y; 1./(1-x).^s(i)];
end
close
plot(x,y,'-'); grid
axis([-25 0 0 1])
xlabel('V_A/V_{bi}'); ylabel('C_J/C_{J0}')
text(-20,.42,'linear (m=1)')
text(-20,.27,'step (m=0)')
text(-20,.10,'hyperabrupt (m=-1)')

(The OCR lost the “1” in the vector m and the dot operators; the version above is the corrected one.)

Results and comments. At the curves reach about , and . The step-junction curve matches the 1N5472A data of Fig. 7.3 well if V. The tuning ratio with and any is largest for the hyperabrupt diode and smallest for the linearly graded diode, as predicted by (7.10).

7.2.3 Parameter Extraction and Profiling

C-V data are used routinely to extract the average doping or the whole doping profile on the lightly doped side. Automated systems exist. The author’s lab uses an MSI C-V meter with a 15 mV rms, 1 MHz probing signal, four capacitance ranges (2, 20, 200, 2000 pF), and an internal DC supply with ranges V (1 mV steps) and V (10 mV steps). A PC controls bias and data; a probe box with a heated chuck (832 T-controller) holds wafers; encapsulated devices go into a spring-clip adapter. The meter measures and removes stray capacitance of cables, probe box and adapter. (Fig. 7.6 is a schematic of this system.)

Step-junction analysis. For an abrupt junction set in (7.7). Invert and square:

\frac{1}{C_J^2}=\frac{2(V_{bi}-V_A)}{qN_BK_S\varepsilon_0A^2}\tag{7.11}

Step 1. is linear in . Step 2. The slope is , so a known area gives . Step 3. The intercept on the axis () gives . A straight line also confirms that the junction is abrupt.

Exercise 7.2: Analysis of 1N5472A data

Problem. The 1N5472A is an - abrupt diode, , with about 2 pF stray capacitance in parallel with the junction. Using the Fig. 7.3 data, apply the plot to confirm abruptness, find the -side doping and quote .

Solution.

  1. Subtract the 2 pF stray capacitance from every measured value to get .
  2. Plot versus (Fig. E7.2): the points fall on an almost perfect line, so the junction is abrupt.
  3. Least squares gives

  1. Compare with (7.11): slope magnitude , so
N_A&=\frac{2}{q\,K_S\varepsilon_0\,A^2\,(9.78\times10^{19})}\\ &=\frac{2}{(1.602\times10^{-19})(11.8\times8.854\times10^{-14})(3.72\times10^{-3})^2(9.78\times10^{19})}\\ &=8.84\times10^{15}\ \mathrm{cm^{-3}} \end{aligned}$$ 5. The intercept over the slope magnitude gives the built-in voltage: $$V_{bi}=\frac{6.89\times10^{19}}{9.78\times10^{19}}=0.70\ \mathrm{V}$$ **Remark.** This $V_{bi}$ is lower than you would compute from the doping ($\approx0.9$ V for $N_A\approx9\times10^{15}$ against a heavily doped $n^+$ side). The intercept is an *extrapolation* and is sensitive to doping variations right near the metallurgical junction, so $V_{bi}$ from C-V data is not trustworthy, while the slope-derived $N_B$ is. **Profiling.** If the profile is not known, we do not need to assume one. Without deriving here (the derivation is Problem 7.5): $$N_B(x)=\frac{2}{qK_S\varepsilon_0A^2\left|\dfrac{d(1/C^2)}{dV_A}\right|}\tag{7.12}$$ $$x=\frac{K_S\varepsilon_0A}{C}\tag{7.13}$$ with $x$ measured from the metallurgical junction into the light side. Putting the step result (7.11) into (7.12) returns a position-independent $N_B$, as required. The process is called **profiling**. It fails for rapidly varying profiles, only a limited depth can be scanned, and the derivative makes the result noisy, but it is simple and widely used. Fig. 7.7 shows an automated profile of a hyperabrupt tuning diode (C809): doping on a log scale (about $10^{15}$ to $10^{17}\ \mathrm{cm^{-3}}$) falling with distance over about 0 to 3 $\mu$m. ### 7.2.4 Reverse-Bias Conductance Every real capacitor leaks, and so does the diode. The differential conductance is the slope of the I-V curve. If the diode follows the signal quasistatically, $\Delta I/\Delta V=dI/dV$, so the low-frequency conductance is $$G_0=\frac{dI}{dV_A}\tag{7.14}$$ **Ideal diode.** With $I=I_0\left(e^{qV_A/kT}-1\right)$: $$G_0=\frac{q}{kT}I_0e^{qV_A/kT}=\frac{q}{kT}(I+I_0)\tag{7.15}$$ For reverse bias beyond a few $kT/q$, $I\to-I_0$ so $G_0\to0$ (the I-V curve is flat). **If R-G current dominates** the reverse current is $I\approx-qAn_iW/2\tau_0$. Using (7.6), $W^{m+2}\propto(V_{bi}-V_A)$, so $$\frac{dW}{dV_A}=-\frac{W}{(m+2)(V_{bi}-V_A)}$$ and therefore $$G_0=\frac{d}{dV_A}\left(-\frac{qAn_iW}{2\tau_0}\right)=\frac{qAn_iW}{2\tau_0(m+2)(V_{bi}-V_A)}\tag{7.16}$$ There is a residual conductance at all reverse biases; its voltage dependence depends on the doping profile. Whatever the case, (7.14) applied to measured I-V data always gives $G_0$. ### Exercise 7.3: Is the reverse-biased diode a pure capacitor? **Problem.** The diode of Fig. 6.10(b) has $C_J=63$ pF at $V_A=-10$ V, and $R_S\approx1\ \Omega$ (Exercise 6.8). At $V_A=-10$ V and $f=100$ kHz, confirm $R_S$ and $G=G_0$ may be neglected. **Solution.** $$G_0=\left.\frac{dI}{dV_A}\right|_{-10\,\mathrm V}=\frac{40\ \mathrm{pA}}{18\ \mathrm V}=2.22\times10^{-12}\ \mathrm S$$ $$\omega C_J=2\pi(10^5)(6.3\times10^{-11})=3.96\times10^{-5}\ \mathrm S$$ Since $\omega C_J\gg G_0$ (ratio $\sim10^7$), $Y\approx j\omega C_J$. For $R_S$ in series with $Y$ compare $|Z|$ with $R_S$: $$\frac{1}{\omega C_J}=2.52\times10^{4}\ \Omega\gg R_S\le1\ \Omega$$ So the diode behaves as an essentially pure capacitor. --- ## 7.3 Forward-Bias Diffusion Admittance ### 7.3.1 General Information Capacitance always comes from charge that oscillates in step (or nearly in step) with the signal. The junction capacitance $C_J$ comes from majority carriers moving in and out at the depletion edges, and its formulas hold unchanged under forward bias. What is new in forward bias is that large numbers of **excess minority carriers** are stored in the quasineutral regions beside the depletion region, and these also oscillate. (Under reverse bias there are so few minority carriers that their contribution is negligible.) Picture Fig. 7.8(a): on a log scale the excess minority profiles $p_n(x)$ and $n_p(x)$ decay away from the depletion edges $x_n,\,-x_p$. When $V_A\to V_A+v_a$ the profile heaves up and down. If the carriers can follow quasistatically, they slide in unison between two straight lines (on the log plot). But minority carriers are supplied and removed far more slowly than majority carriers: their natural timescale is the lifetime $\tau$. When $\omega\tau\to1$ they fall out of phase with the signal, giving an undulating, out-of-phase profile. Out-of-phase charge acts like a resistor (dissipates energy), so **conductance goes up and capacitance goes down** with frequency. > Analogy: pushing a child on a swing. Push slowly and the swing moves in step with you (energy stored, like capacitance). Push too fast for it and it lags, so you are just fighting it (dissipation, like conductance). Because the buildup is caused by the diffusion current, the associated admittance is the **diffusion admittance** $$Y_D=G_D+j\omega C_D\tag{7.17}$$ The total forward-bias admittance is $C_J$ in parallel with $Y_D$ (Fig. 7.8(b): $C_J \parallel C_D \parallel G_D$). **Measurement.** Forward-bias measurement is harder: the large DC current overloads most C-V meters (a few tenths of a volt on Si often gives false readings). The HP 4284A LCR meter with option 001 has an isolation circuit tolerating DC currents up to 0.1 A; it covers 20 Hz to 1 MHz, 5 mV to 20 V rms signal, $\pm40$ V bias, and detects 0.01 fF to 10 F, performing single-point measurements or stepping through ten operator-set values of frequency, bias or signal level. ### 7.3.2 Admittance Relationships The brute-force route repeats the ideal-diode derivation with each DC quantity replaced by DC plus a.c. A cleverer route reuses the DC result. We take a $p^+$-$n$ diode. **Step 1: the equation.** With an a.c. signal on top of DC, the $n$-side excess hole density obeys $$\frac{\partial\Delta p_n(x,t)}{\partial t}=D_P\frac{\partial^2\Delta p_n(x,t)}{\partial x^2}-\frac{\Delta p_n(x,t)}{\tau_p}\tag{7.18}$$ **Step 2: split into DC plus phasor.** $$\Delta p_n(x,t)=\Delta p_n(x)+\tilde p_n(x,\omega)e^{j\omega t}\tag{7.19}$$ ($\Delta p_n(x)$ is the time-invariant part, $\tilde p_n$ the a.c. amplitude.) **Step 3: substitute.** Working out the time derivative: $$j\omega\tilde p_ne^{j\omega t}=D_P\frac{d^2\Delta p_n}{dx^2}+D_P\frac{d^2\tilde p_n}{dx^2}e^{j\omega t}-\frac{\Delta p_n}{\tau_p}-\frac{\tilde p_n}{\tau_p}e^{j\omega t}\tag{7.20}$$ **Step 4: DC and a.c. parts must balance separately.** $$0=D_P\frac{d^2\Delta p_n}{dx^2}-\frac{\Delta p_n}{\tau_p}\tag{7.21a}$$ $$0=D_P\frac{d^2\tilde p_n}{dx^2}-\frac{\tilde p_n}{\tau_p/(1+j\omega\tau_p)}\tag{7.21b}$$ The second follows because $j\omega\tilde p_n+\tilde p_n/\tau_p=\tilde p_n(1+j\omega\tau_p)/\tau_p$. Equation (7.21a) is the usual steady-state diffusion equation; (7.21b) is the **same equation with $\tau_p$ replaced by $\tau_p/(1+j\omega\tau_p)$**. This is the heart of the trick: a complex effective lifetime. **Step 5: boundary conditions.** At $x=\infty$ both vanish. At $x=x_n$ the law of the junction gives $$\Delta p_n(x_n)+\tilde p_n(x_n)=\frac{n_i^2}{N_D}\left(e^{q(V_A+v_a)/kT}-1\right)\tag{7.22}$$ The DC part is $$\Delta p_n(x_n)=\frac{n_i^2}{N_D}\left(e^{qV_A/kT}-1\right)\tag{7.23}$$ Subtracting, and using $e^{qv_a/kT}-1\approx qv_a/kT$ for $v_a\ll kT/q$: $$\tilde p_n(x_n)=\frac{n_i^2}{N_D}e^{qV_A/kT}\left(e^{qv_a/kT}-1\right)\tag{7.24a}$$ $$\approx\frac{n_i^2}{N_D}e^{qV_A/kT}\frac{qv_a}{kT}\tag{7.24b}$$ Here $v_a$ is the amplitude of the a.c. signal. **Step 6: reuse the solution.** The a.c. problem equals the DC problem with two substitutions: $\tau_p\to\tau_p/(1+j\omega\tau_p)$ and $\left[e^{qV_A/kT}-1\right]\to\dfrac{qv_a}{kT}e^{qV_A/kT}$. The DC diffusion current is $$I_{\text{DIFF}}=qA\frac{D_P}{L_P}\frac{n_i^2}{N_D}\left(e^{qV_A/kT}-1\right)=qA\sqrt{\frac{D_P}{\tau_p}}\frac{n_i^2}{N_D}\left(e^{qV_A/kT}-1\right)\tag{7.25}$$ so with the substitution $\sqrt{1/\tau_p}\to\sqrt{(1+j\omega\tau_p)/\tau_p}$: $$i_{\text{diff}}=qA\sqrt{\frac{D_P}{\tau_p}}\sqrt{1+j\omega\tau_p}\;\frac{n_i^2}{N_D}\frac{q}{kT}\,e^{qV_A/kT}\,v_a\tag{7.26}$$ The ideal-diode low-frequency conductance (7.15) for a $p^+$-$n$ diode is $G_0=\dfrac{q}{kT}qA\sqrt{\dfrac{D_P}{\tau_p}}\dfrac{n_i^2}{N_D}e^{qV_A/kT}$ (forward bias beyond a few $kT/q$). Hence $$i_{\text{diff}}=G_0\sqrt{1+j\omega\tau_p}\;v_a\tag{7.27}$$ $$\boxed{Y_D=\frac{i_{\text{diff}}}{v_a}=G_0\sqrt{1+j\omega\tau_p}}\qquad(p^+\text{-}n)\tag{7.28}$$ For an $n^+$-$p$ diode replace $\tau_p\to\tau_n$. For a two-sided junction split $G_0$ into $n$ and $p$ parts and multiply each by its own $\sqrt{1+j\omega\tau}$. **Real and imaginary parts.** Write $\sqrt{1+jx}=a+jb$ with $x=\omega\tau_p$. Squaring: $$\begin{aligned} a^2-b^2&=1\\ 2ab&=x \end{aligned}$$ Taking the modulus of both sides of the squared equation: $a^2+b^2=\left|1+jx\right|=\sqrt{1+x^2}$. Adding and subtracting with $a^2-b^2=1$: $$a^2=\frac{\sqrt{1+x^2}+1}{2},\qquad b^2=\frac{\sqrt{1+x^2}-1}{2}$$ Then $G_D=G_0a$ and $\omega C_D=G_0b$: $$\boxed{G_D=\frac{G_0}{\sqrt2}\left[\sqrt{1+\omega^2\tau_p^2}+1\right]^{1/2}}\tag{7.29a}$$ $$\boxed{C_D=\frac{G_0}{\omega\sqrt2}\left[\sqrt{1+\omega^2\tau_p^2}-1\right]^{1/2}}\tag{7.29b}$$ $G_D$ and $C_D$ depend on both DC bias (through $G_0\propto e^{qV_A/kT}$, very steeply) and frequency. At small forward bias $C_J$ dominates the capacitance; with increasing bias $C_D$ overtakes and eventually swamps $C_J$. **Low-frequency limit** ($\omega\tau_p\ll1$): $\sqrt{1+x^2}\approx1+x^2/2$, so $a\to1$, and $b^2\approx x^2/4$, i.e. $b\approx x/2$: $$G_D\to G_0\tag{7.30a}$$ $$C_D\to\frac{G_0\tau_p}{2}\tag{7.30b}$$ Frequency-independent behaviour holds for $\omega\tau_p\lesssim0.1$. For $\tau_p=1\ \mu$s this means $f\le1/(20\pi\tau_p)\approx16$ kHz. For $\omega\tau_p\gg1$, $G_D$ increases (as $G_0\sqrt{\omega\tau_p/2}$) while $C_D$ decreases (as $\omega^{-1/2}$). Fig. 7.10 plots $G_D/G_0$ and $C_D/C_{D0}$ (with $C_{D0}=G_0\tau/2$) against $\omega\tau$ from 0.01 to 100 on log axes: $G_D$ flat near 1 then rising to about 7 at $\omega\tau=100$; $C_D$ flat near 1 then falling to about 0.14. ### Exercise 7.4: Forward-bias capacitance of the 1N5472A **Problem.** The 1N5472A ($n^+$-$p$, abrupt) has $C_{J0}=120$ pF, $V_{bi}=0.7$ V, $I_0=8\times10^{-13}$ A, $n_I=1.22$, $\tau_n=5\times10^{-7}$ s. (a) Take $\omega\tau_n=0.01$ but use relations valid for arbitrary $\omega\tau_n$; compute and plot $C_J$, $C_D$, $C_J+C_D$ versus $V_A$ for $0\le V_A\le0.65$ V; note where $C_D=C_J$. (b) Repeat for $\omega\tau_n=0.1,1,10,100$ and comment. **Solution logic.** Relations used: $$C_J=\frac{C_{J0}}{\sqrt{1-V_A/V_{bi}}}\ (\text{(7.9), }m=0),\qquad G_0=\frac{qI_0}{kT}e^{qV_A/(n_IkT)},$$ $$C_D=\frac{\tau_nG_0}{\sqrt2\,(\omega\tau_n)}\left[\sqrt{1+(\omega\tau_n)^2}-1\right]^{1/2}$$ The last is (7.29b) rewritten with $\omega=(\omega\tau_n)/\tau_n$. The ideality factor $n_I$ is inserted in the exponent to account for the real diode being non-ideal. ```matlab % Exercise 7.4 -- Forward-bias capacitance clear CJ0 = 120e-12; % farads Vbi = 0.7; % volts Vth = 0.0259; % kT/q in volts taun = 5.0e-7; % seconds I0 = 8.0e-13; % amps n1 = 1.22; % ideality factor wt = input('input the angular-frequency*lifetime product: '); VA = linspace(0,0.65); CJ = CJ0./sqrt(1-VA./Vbi); % junction capacitance G0 = I0/Vth*exp(VA./(n1*Vth)); % low-frequency conductance CD = taun.*G0./(sqrt(2)*wt).*sqrt(sqrt(1+wt^2)-1); % diffusion capacitance % measured forward-bias data (HP4284A) VAm = [0.1 0.2 0.3 0.4 0.42 0.44 0.46 0.48 0.50 0.52 0.54 0.56 0.58]; CDm = [1.31e-10 1.43e-10 1.61e-10 1.88e-10 1.97e-10 2.08e-10 ... 2.23e-10 2.46e-10 2.76e-10 3.46e-10 4.40e-10 6.54e-10 9.38e-10]; close semilogy(VA,CJ,'--r'); axis([0 0.7 1.0e-10 1.0e-9]); grid hold on; semilogy(VA,CD,'-g'); semilogy(VA,CJ+CD,'-y') semilogy(VAm,CDm-2e-12,'o') % subtract 2 pF stray xlabel('V_A (volts)'); ylabel('C (farads)') hold off ``` (The OCR dropped several line-style quotes and minus signs; the above is the repaired logic.) **Results (computed numerically).** (a) For $\omega\tau_n=0.01$ the crossover $C_D=C_J$ occurs at $V_A\approx0.547$ V (the book quotes $\approx0.545$ V). $C_J$ dominates at low forward bias, $C_D$ rises exponentially, and $C_J+C_D$ matches the measured forward C-V data. (b) The same result holds for all $\omega\tau_n<1$ ($\omega\tau_n=0.1$ gives 0.5473 V, $\omega\tau_n=1$ gives 0.5506 V). As $\omega\tau_n$ increases beyond 1, $C_D$ drops at every bias and the crossover moves up: $V_A\approx0.578$ V for $\omega\tau_n=10$, and $0.619$ V for $\omega\tau_n=100$ (book: 0.575 V and 0.62 V). In words: at high frequency the minority carriers cannot keep up, so the diffusion capacitance is suppressed and the junction capacitance wins over a wider range of bias. --- ## 7.4 Summary The chapter modelled the small-signal response of a pn diode in two parts. Under reverse bias the diode is functionally a capacitor, computed by the parallel-plate formula (7.2), but its capacitance falls monotonically with reverse bias. It arises from majority carriers moving in and out about the steady-state depletion width. Reverse-biased diodes serve as capacitors and varactors; capacitance measurements are widely used to extract average doping or doping profiles on the lightly doped side. Under forward bias a large minority-carrier buildup forms next to the depletion region, and its oscillation gives an extra admittance, the diffusion admittance, derived by modifying the ideal diode equation. Its components are strong functions of DC bias, eventually dominating the admittance. For $\omega\tau\gtrsim1$ the minority carriers have trouble following, and the out-of-phase oscillations enhance diffusion conductance at the expense of diffusion capacitance. --- ## Problems, Chapter 7 ### Problem 7.1 (Quick quiz) **(a) Physical origin of the junction capacitance?** The in-and-out movement of majority carriers at the edges of the depletion region (width oscillation) as the a.c. signal alters the reverse bias; this is a charge oscillation like that on parallel plates a distance $W$ apart. **(b) Sketch the $m=-1$ hyperabrupt profile of an $n^+$-$p$ junction.** On the $p$ side ($x>0$): $N_A(x)=b/x$. Sketch: vertical axis $N_A$, horizontal axis $x$. A hyperbola, very large near the junction and falling steadily as $x$ increases; on the $n^+$ side ($x<0$) a constant very high $N_D$ plateau. **(c) Quasistatically:** the carriers respond to the a.c. signal as if it were a DC bias, i.e. their distribution at each instant is the steady-state one for the instantaneous voltage. **(d) Varactor:** a pn diode manufactured to exploit the voltage-variable junction capacitance (variable reactor). **(e) Profiling:** determining the doping concentration as a function of position on the light side from C-V data, using (7.12) and (7.13). **(f) Low-frequency conductance of an ideal diode:** $G_0=\dfrac{q}{kT}(I+I_0)=\dfrac{q}{kT}I_0e^{qV_A/kT}$. Sketch: $G_0$ is $qI_0/kT$ at $V_A=0$, rises exponentially (a straight line on a log axis) for forward bias, and falls smoothly toward zero within a few $kT/q$ of reverse bias, but never goes negative. *Caution to prevent misinterpretation:* $G_0$ is the **slope** of the $I$-$V$ curve, not the current; it is always positive and the reverse part flattens to $0^+$, not to $-I_0$. The sketch is for an ideal diode only; a real diode with R-G current keeps a residual reverse conductance (7.16). **(g) Physical origin of the diffusion admittance:** the oscillation of the excess minority carrier charge stored next to the depletion region edges in response to the a.c. signal. **(h) Why does $G_D$ increase with $\omega\tau_p$ when $\omega\tau_p\ge1$?** The minority carriers cannot follow the signal in step, so the charge oscillation is out of phase with $v_a$. The out-of-phase component of the current is in phase with the voltage, i.e. conductive; hence conductance rises and capacitance falls. --- ### Problem 7.2 (Derive Eq. 7.6) **Problem.** For the one-sided power-law profile (7.5), $N_B(x)=bx^m$, derive $W$ versus $V_A$ for a $p^+$-$n$ junction ($m>-2$). **Solution.** *Assumptions:* depletion approximation; the $p^+$ side is so heavily doped that its depletion layer is negligible; the depletion region on the $n$ side spans $0<x<W$; the space-charge density there is $\rho=qN_B(x)$ (donors). 1. Poisson's equation with $E=0$ at $x=W$ (the field vanishes outside): $$\frac{dE}{dx}=\frac{qN_B(x)}{K_S\varepsilon_0}$$ 2. Integrate from $x$ to $W$ (field magnitude): $$|E(x)|=\frac{q}{K_S\varepsilon_0}\int_x^WN_B(x')\,dx'$$ 3. The total junction potential is the integral of the field across the depletion region: $$V_{bi}-V_A=\int_0^W|E(x)|\,dx=\frac{q}{K_S\varepsilon_0}\int_0^W\int_x^WN_B(x')\,dx'\,dx$$ 4. Swap the order of integration (region $0<x<x'<W$): $$V_{bi}-V_A=\frac{q}{K_S\varepsilon_0}\int_0^WN_B(x')\left[\int_0^{x'}dx\right]dx'=\frac{q}{K_S\varepsilon_0}\int_0^Wx'N_B(x')\,dx'$$ (This first-moment form is valid for every $m>-2$, even $m\le-1$ where the total charge integral would diverge.) 5. Insert $N_B=bx^m$: $$V_{bi}-V_A=\frac{qb}{K_S\varepsilon_0}\int_0^Wx'^{\,m+1}dx'=\frac{qb}{K_S\varepsilon_0}\frac{W^{m+2}}{m+2}$$ The integral converges at 0 only if $m+1>-1$, i.e. $m>-2$. 6. Solve for $W$: $$W^{m+2}=\frac{(m+2)K_S\varepsilon_0}{qb}(V_{bi}-V_A)$$ $$\boxed{W=\left[\frac{(m+2)K_S\varepsilon_0}{qb}(V_{bi}-V_A)\right]^{1/(m+2)}}$$ Check: $m=0,\ b=N_B$ gives $W=[2K_S\varepsilon_0(V_{bi}-V_A)/qN_B]^{1/2}$ (7.3). $\blacksquare$ --- ### Problem 7.3 (Dimensioned C-V program) **Problem.** (a) Write a program giving fully dimensioned reverse-bias C-V curves for Si $p^+$-$n$ abrupt diodes at 300 K, with inputs $A$, $N_B$, and the largest reverse bias. (b) Compare with the 1N5472A data of Fig. 7.3 using $A=3.72\times10^{-3}\ \mathrm{cm^2}$ and $N_B=8.84\times10^{15}\ \mathrm{cm^{-3}}$; does the $V_{bi}$ of Exercise 7.2 matter? (c) How does $N_B$ affect $C_J$? **Assumption.** The inputs do not include $V_{bi}$, which depends on the heavy-side doping. I use $V_{bi}=0.7$ V (the Exercise 7.2 value) as a default that can be overridden, and $K_S=11.8$. **(a) Method.** From (7.7) with $m=0$, $b=N_B$: $$C_J=A\sqrt{\frac{qK_S\varepsilon_0N_B}{2(V_{bi}-V_A)}}$$ ```matlab % Problem 7.3 -- dimensioned reverse-bias C-V for a Si p+-n abrupt diode clear q = 1.602e-19; eps0 = 8.854e-14; KS = 11.8; % cgs-type units (cm, F/cm) A = input('Diode area A (cm^2): '); NB = input('Light-side doping NB (cm^-3): '); Vmax = input('Largest reverse bias of interest, positive number (V): '); Vbi = 0.7; % assumed built-in voltage (V) VA = linspace(0,-Vmax,200); CJ = A*sqrt(q*KS*eps0*NB./(2*(Vbi-VA))); % farads close plot(VA,CJ*1e12); grid xlabel('V_A (volts)'); ylabel('C_J (pF)') ``` **(b) Comparison.** With these numbers: | $V_A$ (V) | 0 | $-1$ | $-5$ | $-10$ | $-25$ | |---|---|---|---|---|---| | $C_J$ (pF), $V_{bi}=0.7$ | 120.9 | 77.6 | 42.4 | 30.9 | 20.0 | | $C_J$ (pF), $V_{bi}=1.0$ | 101.2 | 71.5 | 41.3 | 30.5 | 19.8 | The $V=0$ value of 121 pF agrees with the measured 120 pF, and the curve follows the Fig. 7.3 shape. **Effect of $V_{bi}$:** since $C_J\propto(V_{bi}-V_A)^{-1/2}$, an error in $V_{bi}$ matters near $V_A\approx0$ (121 versus 101 pF) but is negligible at large reverse bias (about 1% at $-25$ V). The $V_{bi}=0.7$ V from the C-V fit gives agreement near zero bias, whereas $V_{bi}\approx0.9$ V computed from the doping would underestimate the zero-bias capacitance by about 12%. So yes, it has bearing, mainly at small biases. **(c) Doping dependence.** $C_J\propto\sqrt{N_B}$ at fixed $V_A$ and $A$. Quadrupling $N_B$ doubles $C_J$ (120.9 to 241.9 pF at 0 V; 30.9 to 61.9 pF at $-10$ V). Physically, higher doping means a narrower depletion width for the same voltage, hence a larger capacitance. --- ### Problem 7.4 (1N4002 C-V data) **Problem.** The 1N4002 $p^+$-$n$ diode data are in Table P7.4. Subtract 3 pF stray capacitance, assume an abrupt profile and $A=6\times10^{-4}\ \mathrm{cm^2}$ (the OCR lost the exponent; this scale gives physically sensible doping), and find $N_B$ and best-fit $V_{bi}$ by (i) eyeballing, (ii) least squares. **Solution.** 1. For each point compute $C_J=C-3$ pF, then $1/C_J^2$ (e.g. $V_A=0$: $C_J=35.709$ pF gives $7.84\times10^{20}\ \mathrm F^{-2}$; $V_A=-15$: $C_J=7.458$ pF gives $1.80\times10^{22}$). 2. Plot $1/C_J^2$ versus $V_A$: roughly straight, bending slightly (the diode is not perfectly abrupt). 3. **(ii) Least squares:** $$\frac{1}{C_J^2}=8.25\times10^{20}-1.123\times10^{21}\,V_A$$ $$N_B=\frac{2}{qK_S\varepsilon_0A^2\,|{\rm slope}|}=\frac{2}{(1.602\times10^{-19})(1.045\times10^{-12})(6\times10^{-4})^2(1.123\times10^{21})}=2.96\times10^{16}\ \mathrm{cm^{-3}}$$ $$V_{bi}=\frac{8.25\times10^{20}}{1.123\times10^{21}}=0.73\ \mathrm V$$ 4. **(i) Eyeballing** a line through the end points ($V_A=0$ and $-15$ V): slope $=-1.146\times10^{21}$, giving $N_B\approx2.9\times10^{16}\ \mathrm{cm^{-3}}$ and $V_{bi}\approx0.68$ V. **Results.** $N_B\approx3\times10^{16}\ \mathrm{cm^{-3}}$ either way; $V_{bi}\approx0.7$ V (0.68 V eyeballed, 0.73 V least squares). --- ### Problem 7.5 (Derive Eqs. 7.12 and 7.13) **Solution.** Take a $p^+$-$n$ junction (the $n^+$-$p$ case is identical). 1. A small change $dV_R$ of the reverse bias moves the light-side depletion edge by $dW$, exposing extra charge there: $$dQ=qAN_B(W)\,dW$$ (the heavily doped side contributes a negligible shift). 2. The incremental capacitance is $C=dQ/dV_R$ with $V_R=-V_A>0$: $$C=qAN_B(W)\frac{dW}{dV_R}$$ 3. The capacitance is also the parallel-plate expression, valid for any profile since the charge sheets sit at the depletion edges a distance $W$ apart: $$W=\frac{K_S\varepsilon_0A}{C}\quad\Rightarrow\quad x=\frac{K_S\varepsilon_0A}{C}\qquad\text{(7.13)}$$ 4. Differentiate: $\dfrac{dW}{dV_R}=-\dfrac{K_S\varepsilon_0A}{C^2}\dfrac{dC}{dV_R}$. 5. Use $\dfrac{d(1/C^2)}{dV_R}=-\dfrac{2}{C^3}\dfrac{dC}{dV_R}$, so $\dfrac{dC}{dV_R}=-\dfrac{C^3}{2}\dfrac{d(1/C^2)}{dV_R}$. Then $$\frac{dW}{dV_R}=\frac{K_S\varepsilon_0A\,C}{2}\frac{d(1/C^2)}{dV_R}$$ 6. Put into step 2: $$C=qAN_B\cdot\frac{K_S\varepsilon_0AC}{2}\frac{d(1/C^2)}{dV_R}\;\Rightarrow\;N_B=\frac{2}{qK_S\varepsilon_0A^2\,\dfrac{d(1/C^2)}{dV_R}}$$ 7. Since $V_R=-V_A$, $d(1/C^2)/dV_R=-d(1/C^2)/dV_A$, and the former is positive. Therefore $$\boxed{N_B(x)=\frac{2}{qK_S\varepsilon_0A^2\left|\dfrac{d(1/C^2)}{dV_A}\right|}}$$ evaluated at $x=K_S\varepsilon_0A/C$. $\blacksquare$ --- ### Problem 7.6 (Profile $N_B(x)$ for the 1N4002) **Logic.** Subtract the stray capacitance, compute $1/C^2$, estimate $d(1/C^2)/dV_A$ by finite differences between consecutive points, assign each derivative to the midpoint capacitance (to get $x$ from (7.13)), then apply (7.12). ```matlab % Problem 7.6 -- C-V profiling clear q = 1.602e-19; e0 = 8.854e-14; KS = 11.8; A = 6e-4; Cs = 3e-12; VA = [0 -.2 -.4 -.6 -.8 -1 -1.4 -1.8 -2.2 -2.6 -3 -4:-1:-15]; C = [38.709 33.717 30.567 28.319 26.598 25.170 23.060 21.490 ... 20.254 19.248 18.405 16.762 15.548 14.599 13.834 13.189 ... 12.639 12.163 11.746 11.373 11.037 10.734 10.458]*1e-12 - Cs; y = 1./C.^2; dy = diff(y)./diff(VA); % d(1/C^2)/dVA Cm = (C(1:end-1)+C(2:end))/2; % midpoint capacitance NB = 2./(q*KS*e0*A^2*abs(dy)); % Eq. 7.12 x = KS*e0*A./Cm; % Eq. 7.13 (cm) close semilogy(x*1e4,NB); grid xlabel('x (\mum)'); ylabel('N_B (cm^{-3})') ``` **Output** (for $A=6\times10^{-4}\ \mathrm{cm^2}$; $x$ in $\mu$m, $N_B$ in $\mathrm{cm^{-3}}$; first point of each pair): | $V_A$ | $x$ | $N_B$ | $V_A$ | $x$ | $N_B$ | |---|---|---|---|---|---| | 0 | 0.190 | $2.41\times10^{16}$ | $-4$ | 0.478 | $3.10\times10^{16}$ | | $-0.2$ | 0.216 | $2.59\times10^{16}$ | $-5$ | 0.520 | $3.07\times10^{16}$ | | $-0.4$ | 0.237 | $2.72\times10^{16}$ | $-6$ | 0.560 | $3.05\times10^{16}$ | | $-0.6$ | 0.257 | $2.81\times10^{16}$ | $-7$ | 0.597 | $2.98\times10^{16}$ | | $-0.8$ | 0.274 | $2.78\times10^{16}$ | $-8$ | 0.633 | $2.94\times10^{16}$ | | $-1.0$ | 0.298 | $2.95\times10^{16}$ | $-9$ | 0.667 | $2.89\times10^{16}$ | | $-1.4$ | 0.326 | $3.02\times10^{16}$ | $-10$ | 0.700 | $2.85\times10^{16}$ | | $-1.8$ | 0.351 | $3.06\times10^{16}$ | $-11$ | 0.733 | $2.79\times10^{16}$ | | $-2.2$ | 0.375 | $3.10\times10^{16}$ | $-12$ | 0.764 | $2.73\times10^{16}$ | | $-2.6$ | 0.396 | $3.12\times10^{16}$ | $-13$ | 0.795 | $2.68\times10^{16}$ | | $-3$ | 0.431 | $3.11\times10^{16}$ | $-14$ | 0.826 | $2.63\times10^{16}$ | The profile is nearly flat at about $3\times10^{16}\ \mathrm{cm^{-3}}$ (consistent with an abrupt junction and Problem 7.4), with some noise from differentiation and a slight drop near the junction and deep in the bulk. --- ### Problem 7.7 (Verify Fig. 7.10) **Solution.** With $x=\omega\tau_p$: $G_D/G_0=\sqrt{(\sqrt{1+x^2}+1)/2}$, and since $C_{D0}=G_0\tau_p/2$, $$\frac{C_D}{C_{D0}}=\frac{2}{x}\sqrt{\frac{\sqrt{1+x^2}-1}{2}}$$ ```matlab x = logspace(-2,2,200); s = sqrt(1+x.^2); GD = sqrt((s+1)/2); % G_D/G_0 CD = (2./x).*sqrt((s-1)/2); % C_D/C_D0 loglog(x,GD,x,CD); grid xlabel('\omega\tau_p'); ylabel('normalized G_D, C_D'); legend('G_D/G_0','C_D/C_{D0}') ``` | $\omega\tau_p$ | 0.01 | 0.1 | 0.3 | 1 | 3 | 10 | 30 | 100 | |---|---|---|---|---|---|---|---|---| | $G_D/G_0$ | 1.000 | 1.001 | 1.011 | 1.099 | 1.443 | 2.351 | 3.938 | 7.107 | | $C_D/C_{D0}$ | 1.000 | 0.999 | 0.989 | 0.910 | 0.693 | 0.425 | 0.254 | 0.141 | These agree with Fig. 7.10: both are flat below $\omega\tau\approx0.1$, then $G_D$ climbs and $C_D$ drops. $\blacksquare$ --- ### Problem 7.8 (Relative size of $\omega C_D$ and $G_D$) **Solution.** 1. From (7.29): $\dfrac{\omega C_D}{G_D}=\dfrac{b}{a}=\sqrt{\dfrac{\sqrt{1+x^2}-1}{\sqrt{1+x^2}+1}}$, $x=\omega\tau_p$. 2. For $x\ll1$: using $\sqrt{1+x^2}\approx1+x^2/2$, the ratio is $\sqrt{(x^2/2)/2}=x/2$. This agrees with (7.30): $\omega C_D/G_D=\omega\tau_p/2$. 3. For $x\gg1$: $\sqrt{1+x^2}\approx x$, the ratio is $\sqrt{(x-1)/(x+1)}\to1$. 4. Compact form: $\sqrt{1+jx}=(1+x^2)^{1/4}e^{j\theta/2}$ with $\theta=\arctan x$, so the ratio equals $\tan(\theta/2)$. ```matlab x = logspace(-2,2,200); s = sqrt(1+x.^2); r = sqrt((s-1)./(s+1)); loglog(x,r,x,x/2,'--',x,ones(size(x)),'--'); grid xlabel('\omega\tau_p'); ylabel('\omega C_D / G_D') ``` | $x$ | 0.01 | 0.1 | 0.3 | 1 | 3 | 10 | 30 | 100 | |---|---|---|---|---|---|---|---|---| | $\omega C_D/G_D$ | 0.005 | 0.0499 | 0.147 | 0.414 | 0.721 | 0.905 | 0.967 | 0.990 | The plot follows $x/2$ at the low end and saturates at 1 at the high end, so it does approach the correct limits. **In words:** at low frequency the diffusion admittance is mostly conductive (the capacitive part is only $\omega\tau/2$ of the conductive part); the capacitive component grows with frequency and approaches, but never exceeds, the conductive one (the phase angle of $Y_D$ rises from $0^\circ$ toward $45^\circ$). --- ### Problem 7.9 (Lifetime from forward-bias admittance) **Method.** The measured capacitance includes the junction capacitance and the 2 pF stray capacitance, so isolate the diffusion part: $$C_D=C_{\text{meas}}-2\ \mathrm{pF}-C_J(V_A),\qquad C_J=\frac{120\ \mathrm{pF}}{\sqrt{1-V_A/0.7}}$$ then $\tau_n=2C_D/G_D$ (assuming $\omega\tau_n\ll1$). | $V_A$ (V) | $C_{\text{meas}}$ (pF) | $C_J$ (pF) | $C_D$ (pF) | $G_D$ (S) | $\tau_n=2C_D/G_D$ (s) | |---|---|---|---|---|---| | 0.50 | 276 | 224.5 | 49.5 | $2.00\times10^{-4}$ | $4.95\times10^{-7}$ | | 0.52 | 346 | 236.6 | 107.4 | $3.90\times10^{-4}$ | $5.51\times10^{-7}$ | | 0.54 | 440 | 251.0 | 187.0 | $7.15\times10^{-4}$ | $5.23\times10^{-7}$ | | 0.56 | 654 | 268.3 | 383.7 | $1.33\times10^{-3}$ | $5.77\times10^{-7}$ | | 0.58 | 938 | 289.8 | 646.2 | $2.28\times10^{-3}$ | $5.67\times10^{-7}$ | $$\bar\tau_n\approx5.4\times10^{-7}\ \mathrm s\;(\approx0.54\ \mu\mathrm s)$$ This is close to the $5\times10^{-7}$ s estimate used in Exercise 7.4. --- # Chapter 8: pn Junction Diode: Transient Response A complete diode analysis has four segments: internal electrostatics, steady-state response, small-signal response, and transient response. This chapter handles the last. Diodes are used as electrical **switches**: a pulse flips them from forward bias ("on") to reverse bias ("off") and back. The key question for engineers is how fast. The turn-off transient (on to off) is the speed-limiting one, so we concentrate on it, treating an ideal diode so that ideas, not algebra, take center stage. ## 8.1 Turn-Off Transient ### 8.1.1 Introduction Consider the circuit of Fig. 8.1(a): a battery $V_F$ with resistor $R_F$ on one throw of a switch, a battery $V_R$ with resistor $R_R$ on the other. Before $t=0$ the diode carries a steady forward current $I_F$. At $t=0$ the switch flips. Ideally the current would drop at once to the tiny reverse saturation value. What really happens (Fig. 8.1(b)): - Right after switching the current is **reversed and comparable in magnitude to $I_F$**: $-I_R\approx-V_R/R_R$. - It stays essentially constant at $-I_R$ for a period called the **storage (delay) time $t_s$**. - Then it decays toward the steady-state reverse current. - The time for the reverse current to fall to 10% of its peak magnitude, measured from the instant of switching, is the **reverse recovery time $t_{rr}$**; the **recovery time** is $t_r=t_{rr}-t_s$. Fig. 8.1(c) shows the diode voltage $v_A(t)$: it stays near $V_{ON}$ (still forward) during $0<t<t_s$ even though the applied source is reversed, then swings to $-V_R$. **Assumption:** the batteries are large compared with the diode forward drop $V_{ON}$: $$I_F=\frac{V_F-V_{ON}}{R_F}\approx\frac{V_F}{R_F}\tag{8.1a}$$ $$I_R=\frac{V_R+v_A|_{0<t<t_s}}{R_R}\approx\frac{V_R}{R_R}\tag{8.1b}$$ The decaying tail is easily distorted by stray capacitance, so $t_s$ is the quoted figure of merit. ### 8.1.2 Qualitative Analysis **Why is there a delay?** Forward bias stores excess minority carriers in the quasineutral regions beside the depletion region; reverse bias requires a *deficit* of minority carriers there. To go from on to off, the stored excess (cross-hatched areas of Fig. 8.2, with forward and reverse profiles plotted together on a linear scale) must be removed. The storage delay time is so named because most of the stored charge leaves during this phase. > Analogy: a bathtub full of water (stored carriers). You cannot make it "empty" instantly: you can pull the plug (reverse current) or wait for evaporation (recombination), but neither is instantaneous. There are exactly two removal mechanisms: 1. **Recombination in place.** Not instantaneous; several lifetimes would be needed alone. 2. **Net carrier flow out of the region (reverse current).** The carriers simply flow back across the junction and become majority carriers on the other side. The crossing itself takes only $W/v\sim10^{-10}$ s, but the *number per second* is limited by the circuit: the maximum reverse current is about $V_R/R_R=I_R$. Replacing $R_R$ with a short would speed things up but could destroy the diode. Neither can safely be instantaneous, so there is a delay. **Why does the diode stay forward biased for $0<t<t_s$?** The depletion-edge boundary condition $p_n(x_n)=p_{n0}e^{qv_A/kT}$ holds under transient conditions too. If $v_A>0$ there is an excess above equilibrium at the edge. Conversely, an excess above equilibrium at $x_n$ **means** the junction is forward biased: the residual excess maintains the forward bias. Only when the concentration at $x_n$ drops below equilibrium does the diode become reverse biased (the end of $t_s$). Fig. 8.3 shows the progressive decay of the hole excess in a $p^+$-$n$ diode for $0\le t\le t_s$: curves marching downward until $p_n(x_n)=p_{n0}$ at $t=t_s$. **Slope at $x_n$.** In an ideal $p^+$-$n$ diode $i=i_{\text{diff}}=-qAD_P\left.\dfrac{d\Delta p_n}{dx}\right|_{x_n}$, so $$\left.\frac{d\Delta p_n}{dx}\right|_{x=x_n}=-\frac{i}{qAD_P}\tag{8.2}$$ During $0<t\le t_s$, $i=-I_R<0$, so every curve slopes **upward** at $x_n$ and, since $i=-I_R$ is constant, **all curves have the same slope at $x_n$**. ### Exercise 8.1: Predicting the effect of parameters **Problem.** Sketch (dashed) the modification of a baseline $i$-$t$ transient if (a) $I_F$ increases, (b) $I_R$ increases, (c) $\tau_p$ decreases. **Solution.** (a) Larger $I_F$ means more stored charge with the removal rate unchanged, so $t_s$ increases (a longer plateau at the same height). (b) Larger $I_R$ increases the reverse-current removal rate: the plateau is *taller* (more negative) and $t_s$ is reduced. (c) Shorter $\tau_p$ increases the recombination rate (and also reduces the stored charge $I_F\tau_p$): $t_s$ is shorter. (Fig. E8.1 shows these three modified plateaus.) ### 8.1.3 The Storage Delay Time **Quantitative analysis.** Use an ideal $p^+$-$n$ step diode and charge control. The electron charge on the $p^+$ side is negligible compared with the stored hole charge $Q_P$ on the $n$ side, and $i=i_{DIFF}$; the charge-control equation (6.56) is $$i=\frac{dQ_P}{dt}+\frac{Q_P}{\tau_p}\tag{8.3}$$ (The current feeds charge buildup plus recombination loss.) **Step 1.** For $0^+\le t\le t_s$, $i=-I_R$ (constant): $$\frac{dQ_P}{dt}=-I_R-\frac{Q_P}{\tau_p}\tag{8.4}$$ **Step 2.** Separate variables and integrate from $t=0^+$ to $t_s$ (multiply the equation by $\tau_p$ to see the form $dQ_P/(\tau_pI_R+Q_P)=-dt/\tau_p$): $$\int_{Q_P(0^+)}^{Q_P(t_s)}\frac{dQ_P}{\tau_pI_R+Q_P}=-\frac{1}{\tau_p}\int_{0^+}^{t_s}dt\tag{8.5}$$ **Step 3.** Evaluate ($\int dQ/(a+Q)=\ln(a+Q)$ with $a=\tau_pI_R$): $$t_s=\tau_p\ln\frac{I_R\tau_p+Q_P(0^+)}{I_R\tau_p+Q_P(t_s)}=\tau_p\ln\left(\frac{I_R+Q_P(0^+)/\tau_p}{I_R+Q_P(t_s)/\tau_p}\right)\tag{8.6}$$ **Step 4: initial condition.** Charge cannot change instantly, so $Q_P(0^+)=Q_P(0^-)$. Before switching $dQ_P/dt=0$ and $i=I_F$, so (8.3) gives $$I_F=\frac{Q_P(0^-)}{\tau_p}=\frac{Q_P(0^+)}{\tau_p}\tag{8.7}$$ **Step 5: final condition.** The charge left at $t_s$ is hard to know. To be conservative (an estimate of $t_s$ that is too large), take $Q_P(t_s)\approx0$. Then $$\boxed{t_s=\tau_p\ln\left(1+\frac{I_F}{I_R}\right)}\tag{8.8}$$ This agrees with Exercise 8.1: $t_s$ rises with $I_F$, falls with $I_R$, and is proportional to $\tau_p$. **The more precise result.** A complete $\Delta p_n(x,t)$ solution that properly accounts for residual charge gives $$\operatorname{erf}\sqrt{\frac{t_s}{\tau_p}}=\frac{1}{1+I_R/I_F}\tag{8.9}$$ equivalently $t_s=\tau_p\left[\operatorname{erf}^{-1}\!\left(\dfrac{1}{1+I_R/I_F}\right)\right]^2$ (this is the form coded in the CPG program of Exercise 8.2, where I derive it). It looks very different, but it also agrees with every qualitative prediction. **Measurement.** $t_s\propto\tau_p$ and the only other parameters are the circuit currents, so measuring a turn-off transient yields the minority carrier lifetime on the light side of an asymmetrical junction. The measurement system of Fig. 8.4 (for $\mu$s-range lifetimes) uses a Tektronix PS5004 supply (sets $I_F$), an FG5010 function generator giving a negative-going square pulse, a series capacitor (200 $\mu$F) that holds its voltage during the step so the diode-side voltage jumps down by the pulse amplitude, resistors (1000, 150, 100 $\Omega$), the test diode, and a Tektronix 11401 digitizing scope reading a voltage proportional to diode current. Circuit RC constants are $\ge10^{-2}$ s, so capacitor discharge is negligible. Fig. 8.5 shows a sample transient. **Sample analysis.** From the response curve: $I_R/I_F\approx1.0$ and $t_s\approx5.0\ \mu$s. Then $$\tau_p=\frac{t_s}{\ln(1+I_F/I_R)}=\frac{5.0}{\ln2}=7.2\ \mu\mathrm s\quad\text{(Eq. 8.8)}$$ and from (8.9), $\operatorname{erf}^{-1}(1/2)=0.4769$, so $\sqrt{t_s/\tau_p}=0.4769$ and $$\tau_p=\frac{5.0}{0.4769^2}=22\ \mu\mathrm s\quad\text{(Eq. 8.9)}$$ A better determination varies $I_R/I_F$ and chooses the $\tau_p$ giving the best fit to the normalized $t_s/\tau_p$ versus $I_R/I_F$ curve (Fig. 8.6: dashed from (8.8), solid from (8.9), log axes, $0.01<I_R/I_F<10$). A 1N91 Ge diode fits the exact theory with $\tau_p=14.5\ \mu$s. A 1N4002 Si diode deviates: no single $\tau_p$ fits both ends, because Si diodes are rarely ideal (the derivation assumed an ideal diode). ### 8.1.4 General Information Practical remarks: - As a rule $t_s\sim\tau_p$ (or $\tau_n$). Raising $I_R/I_F$ lowers $t_s$ below $\tau_p$ (Fig. 8.6) but circuit constraints often limit $I_R/I_F$. - Build diodes with short minority carrier lifetimes. Since $\tau\propto1/N_T$ ($N_T$ the R-G center concentration), deliberately introduce R-G centers (in Si, by diffusing in gold). The limit: a shorter lifetime proportionally increases R-G current ($\propto1/\tau_0$), so the off-state current may become unacceptable, and R-G center concentrations near the doping level alter the electrostatics. - For sub-nanosecond switching use devices with less stored charge: the bipolar junction transistor or the metal-semiconductor diode (later chapters). - **Step-recovery (snap-back) diode:** $t_r$ is very short ($\sim1$ ns) with $t_s\sim1\ \mu$s, so the reverse current looks like a step, "snapping back" at $t=t_s$. Used as pulse generators and high-order, single-stage harmonic generators. It is built as a $p$-$i$-$n$ type structure: a narrow, lightly doped region between heavily doped $p$ and $n$ regions, formed epitaxially with very abrupt junctions. The profile stores the minority charge very close to the depletion edges, so almost all of it is removed by $t_s$; with nothing left to remove, the current drops abruptly. ## 8.2 Turn-On Transient The diode is switched from the reverse-bias off state to the forward on state, by current pulse, voltage pulse, or a mix. We take a current pulse for simplicity. When the current is suddenly changed from its reverse value to a constant forward current $I_F$, $v_A(t)$ rises monotonically from $V_{OFF}$ at $t=0$ to $V_{ON}$ at $t=\infty$. The first stage (until $v_A=0$) is extremely brief: few carriers are needed and they cross the thin depletion region fast, while majority carriers shrink the depletion width to its zero-bias value. We therefore treat the diode as pulsed from $i=0$ to $i=I_F$ at $t=0$ with $v_A(0)=0$ (Fig. 8.7(a) current step, 8.7(b) voltage rising from zero toward $V_{ON}$). Again an ideal $p^+$-$n$ diode with charge control. $Q_P=0$ at $t=0$ (Fig. 8.8: hole profiles growing from $p_{n0}$ toward the steady-state curve, $t=0$ to $t=\infty$). With $i=I_F$ throughout, (8.3) becomes $$\frac{dQ_P}{dt}=I_F-\frac{Q_P}{\tau_p}\tag{8.10}$$ Separate variables and integrate: $$\int_0^{Q_P(t)}\frac{dQ_P}{I_F-Q_P/\tau_p}=\int_0^tdt'=t\tag{8.11}$$ $$-\tau_p\ln\left(1-\frac{Q_P(t)}{I_F\tau_p}\right)=t\tag{8.12}$$ Solving for $Q_P(t)$: $$\boxed{Q_P(t)=I_F\tau_p\left(1-e^{-t/\tau_p}\right)}\tag{8.13}$$ (its final value is $Q_P(\infty)=I_F\tau_p$, also seen from (8.10) with $dQ/dt=0$.) **Voltage.** In steady state the stored hole charge is $$Q_P=I_{DIFF}\tau_p=I_0\tau_p\left(e^{qV_A/kT}-1\right)\tag{8.14}$$ Assume build-up is **quasistatic**: $Q_P(t)$ obeys (8.14) with $V_A\to v_A(t)$: $$Q_P(t)=I_0\tau_p\left(e^{qv_A(t)/kT}-1\right)\tag{8.15}$$ Equate (8.13) and (8.15): $$I_0\left(e^{qv_A/kT}-1\right)=I_F\left(1-e^{-t/\tau_p}\right)$$ $$e^{qv_A/kT}=1+\frac{I_F}{I_0}\left(1-e^{-t/\tau_p}\right)$$ $$\boxed{v_A(t)=\frac{kT}{q}\ln\left[1+\frac{I_F}{I_0}\left(1-e^{-t/\tau_p}\right)\right]}\tag{8.16}$$ **Discussion.** The transient lengthens with $I_F$ and $\tau_p$, as expected, because the required charge $Q_P(\infty)=I_F\tau_p$ grows with them. The interesting feature: an initial **very rapid rise** of $v_A$ to a large fraction of $V_{ON}$ in a tiny time, then a slow final approach taking several $\tau_p$. Example: $T=300$ K, $V_{ON}=0.75$ V, so $I_F/I_0=3.77\times10^{12}$. At $t=0.01\tau_p$: $$v_A=0.0259\ln\left[1+3.77\times10^{12}(0.00995)\right]=0.0259\times24.35=0.631\ \mathrm V=0.84\,V_{ON}$$ because the logarithm compresses large factors. Reaching the last few percent needs several lifetimes. ### Exercise 8.2: Concentration Plot Generation (CPG) program **Purpose.** The CPG program plots $\Delta p_n(x',t)/\Delta p_{n,\max}$ versus $x'/L_P=(x-x_n)/L_P$ at selected $t/\tau_p$ for turn-off and turn-on, from direct solution of the time-dependent diffusion equation for an ideal step junction. Menu options: linear or semilog turn-off, linear or semilog turn-on. For turn-off, $t$ steps from $0.1t_s$ to $t_s$ in increments of $0.1t_s$ (the user supplies $I_R/I_F$); for turn-on, $t$ steps from $0.1\tau_p$ to $2\tau_p$ in $0.1\tau_p$ steps. Figs. 8.3 and 8.8 were produced from it. **The math inside the code.** Let $X=x'/L_P$, $T=t/\tau_p$. The turn-on solution for a current step $I_F$, normalized by the steady-state edge value, is $$y_{on}(X,T)=\frac12\left[e^{-X}\operatorname{erfc}\left(\frac{X}{2\sqrt T}-\sqrt T\right)-e^{X}\operatorname{erfc}\left(\frac{X}{2\sqrt T}+\sqrt T\right)\right]$$ which tends to $e^{-X}$ as $T\to\infty$ (the steady profile) and gives $y_{on}(0,T)=\operatorname{erf}\sqrt T$. (The code writes $\operatorname{erfc}=1-\operatorname{erf}$.) **Turn-off by superposition.** The diffusion equation is linear. The turn-off profile is the initial steady profile $e^{-X}$ (current $I_F$) plus the response to a *step of current* from $I_F$ to $-I_R$, i.e. a step of $-(I_F+I_R)$. The response to a unit $I_F$ step is $y_{on}$, so $$y_{off}(X,T)=e^{-X}-\left(1+\frac{I_R}{I_F}\right)y_{on}(X,T)$$ **Where $t_s$ comes from.** $t_s$ is the instant when $y_{off}(0,T)=0$ (edge concentration equals equilibrium): $$1-\left(1+\frac{I_R}{I_F}\right)\operatorname{erf}\sqrt{T_s}=0\;\Rightarrow\;\operatorname{erf}\sqrt{\frac{t_s}{\tau_p}}=\frac{1}{1+I_R/I_F}$$ which is exactly Eq. (8.9). The code therefore sets `TS=(erfinv(1./(1+Iratio)))^2`. (For $I_R=0$, `erfinv(1)` is infinite, so the code sets `TS=1`, an arbitrary display scale.) ```matlab % Exercise 8.2 -- Turn-off/Turn-on Concentration Plot Generator clear close S = menu('Choose the desired plot','OFF-Linear','OFF-Semilog', ... 'ON-Linear','ON-Semilog'); % Compute ts/taup if a turn-off plot is desired if S <= 2 Iratio = input('Please input the IR/IF ratio: IR/IF = '); if Iratio == 0 % catch IR = 0 TS = 1; else TS = (erfinv(1./(1+Iratio)))^2; % ts/taup from Eq. 8.9 end else TS = 1; % not used for turn-on end % Set X = x'/LP and T = t/taup X = 0:0.03:3; if S == 1 || S == 2 T = TS/10:TS/10:TS; else T = 0.1:0.1:2; end % Steady-state curve and axes y0 = exp(-X); if S == 1 || S == 3 plot(X,y0,'g'); axis([0 3 0 1]) else semilogy(X,y0,'g'); axis([0 3 1.0e-3 1]) end xlabel('x''/L_P'); ylabel('\Deltap_n(x'',t)/\Deltap_{n,max}') grid; hold on % Time-dependent curves for i = 1:length(T) A = exp(-X).*(1-erf(X./(2*sqrt(T(i)))-sqrt(T(i)))); B = exp( X).*(1-erf(X./(2*sqrt(T(i)))+sqrt(T(i)))); yon = (A-B)/2; % turn-on profile if S == 3, plot(X,yon); elseif S == 1, yoff = exp(-X)-(1+Iratio).*yon; plot(X,yoff); elseif S == 4, semilogy(X,yon); elseif S == 2, yoff = exp(-X)-(1+Iratio).*yon; semilogy(X,yoff); end end hold off ``` (OCR repairs: lost parentheses and quotes were restored; the chain of `elseif` branches replaces the original separate `if` blocks with identical behaviour.) **Suggested uses** (the book's list, with answer hints): 1. Visualize stored-charge decay during turn-off. 2. Visualize stored-charge buildup during turn-on. 3. Compare linear and semilog plots. 4. Confirm that the slopes at $x'=0$ of the linear turn-off curves are all equal for $0<t\le t_s$ (they are, by (8.2) with constant $i$). On a semilog plot the slopes are *not* equal: the semilog slope is $(d\Delta p/dx)/\Delta p$, i.e. the current divided by the edge concentration, which differs from curve to curve. 5. Examine the effect of $I_R/I_F$ on the decay. 6. See why (8.8) becomes less accurate as $I_R/I_F$ grows: the stored charge remaining at $t_s$ grows relative to the assumed zero. 7. Check the quasistatic approximation of (8.16): on a semilog plot, quasistatic turn-on curves would all be parallel to the $t=\infty$ curve. 8. Compare $v_A(t)$ from (8.16) with the $v_A$ deduced from the turn-on plot (done in Problem 8.8). --- ## 8.3 Summary We examined the electrical and internal carrier response of pn diodes subjected to a large, rapid change of applied voltage or current. During turn-off the excess minority carriers stored in the quasineutral regions must be removed before steady state is regained. The diode initially remains forward biased while a large, constant reverse current flows, until the carrier concentrations at the depletion edges fall to equilibrium. This period is the **storage delay time $t_s$**, the primary figure of merit. It increases with the initial stored charge, decreases with the rate of removal by reverse current, and is directly proportional to the minority carrier lifetime. It is reduced by adding R-G centers during fabrication, and step-recovery diodes are made by tailoring the doping profile. Turn-off measurements also give the lifetime on the lightly doped side. The chapter's focus was a basic understanding of transient operation and physical insight, useful for the bipolar junction transistor. --- ## Problems, Chapter 8 ### Problem 8.1 (Quick quiz) **(a) Storage delay time $t_s$:** the time after switching during which the reverse current stays essentially constant at $-I_R$ (until the minority carrier concentrations at the depletion edges fall to their equilibrium values). **(b) Recovery time $t_r$:** $t_r=t_{rr}-t_s$, the time for the reverse current to decay from the end of the storage phase to 10% of its maximum magnitude ($t_{rr}$ is the total reverse recovery time). **(c)** The OCR lost the statement of part (c) ("...Explain."). The transient question of that kind in the text is why the diode stays forward biased for $0<t<t_s$ even though the source is reversed, so I answer that: the excess minority carriers still at the depletion edges satisfy $p_n(x_n)=p_{n0}e^{qv_A/kT}>p_{n0}$, meaning $v_A>0$; only when that excess is gone does the junction go reverse biased. The reverse current is set by the *slope* of the profile, not the sign of the voltage. **(d) Root cause of the delay:** the stored excess minority carrier charge (built up under forward bias) must be removed before the diode can go to the off state. **(e) The two removal mechanisms:** recombination in the quasineutral regions and net carrier flow out (reverse current) back across the junction. **(f) True or false: if $\Delta p_n(x,t)>0$ at the edge, $v_A>0$.** True: $p_n(x_n)=p_{n0}e^{qv_A/kT}$, so an excess requires $v_A>0$. **(g) True or false: if $i>0$ (the OCR dropped the symbol; I read it as forward current), the slope of $p_n(x)$ at $x_n$ must be positive.** From (8.2), $d\Delta p_n/dx=-i/(qAD_P)$, so $i>0$ gives a **negative** slope: **False**. (A positive slope occurs for $i<0$, as in the turn-off transient.) **(h) Special properties of a step-recovery diode:** a narrow lightly doped region between heavily doped $p$ and $n$ regions, with very abrupt junctions, so stored charge sits near the depletion edges; almost all of it is removed by $t_s$ and the current snaps back with $t_r\sim1$ ns. **(i) True or false: doubling both $I_F$ and $I_R$ has no effect on $t_s$.** True: by (8.8) $t_s=\tau_p\ln(1+I_F/I_R)$ depends only on the ratio, which is unchanged (also true of (8.9)). **(j) True or false: recombination retards the buildup of stored carriers during turn-on.** True: in $dQ_P/dt=I_F-Q_P/\tau_p$ the term $-Q_P/\tau_p$ is a loss; it reduces the net rate of increase and limits $Q_P$ to $I_F\tau_p$. --- ### Problem 8.2 (Interpret a $p_n(x,t)$ plot) **Missing figure.** Fig. P8.2 is a plot of $p_n(x)$ on the $n$ side at some instant, with the equilibrium value $p_{n0}$ marked. **Assumption:** the curve starts at $x_n$ above $p_{n0}$ (I take $p_n(x_n)=2p_{n0}$, the only numeric label the OCR preserved) and rises with $x$ (slope upward), like the Fig. 8.3 turn-off curves. The general formula is given so the figure's actual value can be substituted. **(a) Forward or reverse biased?** $p_n(x_n)=p_{n0}e^{qv_A/kT}$. Since $p_n(x_n)>p_{n0}$, $e^{qv_A/kT}>1$, so $v_A>0$: **forward biased**. **(b)** With $p_{n0}=10^4\ \mathrm{cm^{-3}}$, $T=300$ K and $p_n(x_n)=2\times10^4\ \mathrm{cm^{-3}}$: $$v_A=\frac{kT}{q}\ln\frac{p_n(x_n)}{p_{n0}}=0.0259\ln2=17.9\ \mathrm{mV}$$ (General: $v_A=0.0259\ln\alpha$ V for $p_n(x_n)=\alpha p_{n0}$; $p_{n0}$ cancels.) **(c) Direction of current.** With the profile sloping upward at $x_n$ ($dp_n/dx>0$), (8.2) gives $i=-qAD_P\,dp_n/dx<0$: a **reverse current** flows (holes diffuse back toward the junction) even though the junction is forward biased. This is the storage phase of turn-off. (A downward-sloping curve would mean forward current.) --- ### Problem 8.3 (Improved $Q_P(t_s)$ approximation) **Reconstruction of the OCR-garbled statement.** The OCR keeps only fragments: a numerator with $I_F$, a denominator $1+\dots$, and a final $t_s$ expression with "$(1+\dots)$" and "$1+2\dots$". The reading consistent with those fragments, and which I checked reproduces the exact erf behaviour closely, is $$Q_P(t_s)\approx\frac{I_F\tau_p}{1+I_F/I_R}=\tau_p\frac{I_FI_R}{I_F+I_R}$$ This is my stated assumption. **Solution.** Let $r\equiv I_R/I_F$. 1. Use (8.6) with $Q_P(0^+)=I_F\tau_p$: $$t_s=\tau_p\ln\frac{I_R+I_F}{I_R+Q_P(t_s)/\tau_p}$$ 2. Insert $Q_P(t_s)/\tau_p=I_Fr/(1+r)$ and $I_R=rI_F$: $$t_s=\tau_p\ln\frac{1+r}{r+\dfrac{r}{1+r}}=\tau_p\ln\frac{(1+r)^2}{r\,(2+r)}$$ $$\boxed{t_s=\tau_p\ln\left[\frac{(1+I_R/I_F)^2}{(I_R/I_F)\,(2+I_R/I_F)}\right]}$$ Check: as $r\to\infty$ the argument tends to 1 so $t_s\to0$, as it should. 3. Numerical comparison: | $I_R/I_F$ | 0.01 | 0.05 | 0.1 | 0.2 | 0.5 | 1 | 2 | 5 | 10 | |---|---|---|---|---|---|---|---|---|---| | (8.8) | 4.615 | 3.045 | 2.398 | 1.792 | 1.099 | 0.693 | 0.405 | 0.182 | 0.095 | | Revised | 3.927 | 2.376 | 1.751 | 1.186 | 0.588 | 0.288 | 0.118 | 0.028 | 0.0083 | | Exact (8.9) | 3.326 | 1.962 | 1.429 | 0.956 | 0.468 | 0.2275 | 0.093 | 0.022 | 0.0065 | ```matlab r = logspace(-2,1,100); ts_old = log(1+1./r); ts_new = log((1+r).^2./(r.*(2+r))); ts_ex = (erfinv(1./(1+r))).^2; loglog(r,ts_old,'--',r,ts_new,'-.',r,ts_ex,'-'); grid xlabel('I_R/I_F'); ylabel('t_s/\tau_p'); legend('Eq. 8.8','revised','Eq. 8.9') ``` **Comment.** The revised expression is a clear improvement: it is roughly 15 to 30% above the exact result, whereas (8.8) is 40% to over 1000% too large at large $I_R/I_F$ (0.095 versus 0.0065 at $r=10$). It stays above the exact curve (still conservative) and has the right trend. Its remaining error comes from replacing the real residual charge by a crude closed form. --- ### Problem 8.4 (Open-circuit voltage decay) **(a) Sketch.** After $t=0$, $i=0$, so by (8.2) the slope of $p_n(x)$ at $x_n$ is zero. The initial excess profile loses charge by recombination everywhere: the curves sink downward with a flat (zero-slope) start at $x_n$ and never reach $p_{n0}$ in finite time. (Check with the CPG program by setting the current to zero.) **(b) Stored charge.** With $i=0$, (8.3) becomes $dQ_P/dt=-Q_P/\tau_p$. From (8.7), $Q_P(0)=I_F\tau_p$. So $$Q_P(t)=I_F\tau_p\,e^{-t/\tau_p}$$ **(c) Voltage.** Assume quasistatic decay: $Q_P=I_0\tau_p\left(e^{qv_A/kT}-1\right)\approx I_0\tau_pe^{qv_A/kT}$ for $qv_A/kT\gg1$. 1. Equate: $I_0\tau_pe^{qv_A/kT}=I_F\tau_pe^{-t/\tau_p}$. 2. Take logarithms: $\dfrac{qv_A}{kT}=\ln\dfrac{I_F}{I_0}-\dfrac{t}{\tau_p}$. 3. Use $I_F/I_0=e^{qV_{ON}/kT}-1\approx e^{qV_{ON}/kT}$, so $\ln(I_F/I_0)\approx qV_{ON}/kT$: $$\boxed{v_A(t)=V_{ON}-\frac{kT}{q}\frac{t}{\tau_p}}$$ **(d) What does it suggest?** The open-circuit voltage falls **linearly** in time with slope $-kT/(q\tau_p)$ (about $-26$ mV per lifetime at 300 K). Measuring the slope gives the minority carrier lifetime: $$\tau_p=-\frac{kT}{q}\left(\frac{dv_A}{dt}\right)^{-1}$$ This is the **open-circuit voltage decay (OCVD)** method of lifetime measurement. --- ### Problem 8.5 (Turn-on times) **Given.** $p^+$-$n$ diode pulsed from $0$ to $I_F=1$ mA, $\tau_p=1\ \mu$s (the OCR's "sec" is $\mu$s), $I_0=10^{-15}$ A. Find the times for $v_A$ to reach 90% and 95% of its final value. **Solution.** 1. Final voltage from $I_F=I_0\left(e^{qV_{ON}/kT}-1\right)$: $$V_{ON}=0.0259\ln\left(\frac{10^{-3}}{10^{-15}}+1\right)=0.0259\ln(10^{12})=0.0259(27.63)=0.716\ \mathrm V$$ 2. Required voltages: $0.9V_{ON}=0.644$ V, $0.95V_{ON}=0.680$ V. 3. Rearranging (8.16): $1-e^{-t/\tau_p}=\dfrac{e^{qv_A/kT}-1}{I_F/I_0}$, so $t=-\tau_p\ln\left[1-\dfrac{e^{qv_A/kT}-1}{I_F/I_0}\right]$. 4. **90%:** $e^{0.644/0.0259}=e^{24.87}=6.3\times10^{10}$, so the fraction is $6.3\times10^{10}/10^{12}=0.0631$: $$t_{90}=-(1\ \mu\mathrm s)\ln(1-0.0631)=0.065\ \mu\mathrm s=65\ \mathrm{ns}$$ 5. **95%:** $e^{0.680/0.0259}=e^{26.25}=2.5\times10^{11}$, fraction $=0.251$: $$t_{95}=-(1\ \mu\mathrm s)\ln(1-0.251)=0.289\ \mu\mathrm s=289\ \mathrm{ns}$$ The last 5% of the voltage takes about 4.4 times as long as the first 90%: fast rise, slow finish. --- ### Problem 8.6 (Pulse from $I_{F1}$ to $I_{F2}>I_{F1}$) **(a) Sketch.** Initially $p_n(x)$ is the steady profile for $I_{F1}$. At $t=0$ the current jumps to $I_{F2}$ and the profile grows upward at every point, with a steeper slope at $x_n$ (the edge slope is proportional to the current), the edge value rising quickly at first and finally approaching the larger steady curve for $I_{F2}$ as $t\to\infty$ (like Fig. 8.8 but starting from a nonzero curve). **(b) $v_A(t)$.** Charge control with $i=I_{F2}$ for $t>0$ and $Q_P(0)=I_{F1}\tau_p$ (from (8.7)): 1. $\dfrac{dQ_P}{dt}=I_{F2}-\dfrac{Q_P}{\tau_p}$. 2. Let $u=Q_P-I_{F2}\tau_p$; then $du/dt=-u/\tau_p$ with $u(0)=(I_{F1}-I_{F2})\tau_p$, so $u=u(0)e^{-t/\tau_p}$. 3. Therefore $$Q_P(t)=I_{F2}\tau_p-(I_{F2}-I_{F1})\tau_pe^{-t/\tau_p}$$ 4. Quasistatic: $Q_P=I_0\tau_p\left(e^{qv_A/kT}-1\right)$. Equate: $$e^{qv_A/kT}=1+\frac{I_{F2}}{I_0}-\frac{I_{F2}-I_{F1}}{I_0}e^{-t/\tau_p}$$ $$\boxed{v_A(t)=\frac{kT}{q}\ln\left[1+\frac{I_{F2}}{I_0}-\frac{I_{F2}-I_{F1}}{I_0}e^{-t/\tau_p}\right]}$$ Checks: $t=0$ gives $\frac{kT}{q}\ln(1+I_{F1}/I_0)=V_{ON1}$; $t\to\infty$ gives $V_{ON2}$; setting $I_{F1}=0$ recovers (8.16). --- ### Problem 8.7 (Combined turn-off / turn-on) **Missing text.** The OCR of the statement is truncated (it keeps only "...$-1$ mA. After 1 $\mu$sec a current pulse is applied to switch the diode back to ... mA. Assume the diode is ideal with $\tau_p=1\ \mu$sec."). I adopt this reading: an ideal $p^+$-$n$ diode carries $I_F=+1$ mA for $t<0$; at $t=0$ the circuit drives $-1$ mA (so $I_R=1$ mA); after $1\ \mu$s it is switched back to $+1$ mA. Reverse current can flow at $-I_R$ only while stored charge remains. **(a) Sketch of $i(t)$.** 1. $t<0$: $+1$ mA. 2. $0<t<t_s$: $-1$ mA (storage phase). From (8.8), $t_s=\tau_p\ln(1+I_F/I_R)=1\ \mu\mathrm s\times\ln2=0.693\ \mu$s, which is less than $1\ \mu$s. 3. $t_s<t<1\ \mu$s: the stored charge has run out; the current drops quickly to the tiny reverse saturation current ($\approx0$ on this scale). 4. $t>1\ \mu$s: $+1$ mA again. **(b) $v_A(t)$ for $t>1\ \mu$s.** At $1\ \mu$s the diode has been reverse biased since $t_s=0.693\ \mu$s, so the stored charge is essentially zero ($Q_P\approx0$) and the diode restarts like a turn-on from $v_A\approx0$. With $t'=t-1\ \mu$s, from (8.13) and (8.16): $$Q_P(t)=I_F\tau_p\left(1-e^{-(t-1\,\mu\mathrm s)/\tau_p}\right)$$ $$\boxed{v_A(t)=\frac{kT}{q}\ln\left[1+\frac{I_F}{I_0}\left(1-e^{-(t-1\,\mu\mathrm s)/(1\,\mu\mathrm s)}\right)\right]},\quad t>1\ \mu\mathrm s,\ I_F=1\ \mathrm{mA}$$ ($I_0$ is not given in the surviving text, so the result stays in terms of $I_0$; with $I_0=10^{-15}$ A it reproduces the Problem 8.5 curve.) Neglected residual charge and depletion-capacitance charging would make the true voltage rise slightly faster. --- ### Problem 8.8 (Compare exact and quasistatic turn-on) **(a) Exact $v_A(t)$.** From Exercise 8.2 the turn-on edge value is $\Delta p_n(0,t)/\Delta p_{n,\max}=\operatorname{erf}\sqrt{t/\tau_p}$ (the first element of `yon`, at `X=0`). The edge boundary condition and steady value give $$\frac{\Delta p_n(0,t)}{\Delta p_{n,\max}}=\frac{e^{qv_A(t)/kT}-1}{e^{qV_{ON}/kT}-1}=\operatorname{erf}\sqrt{\frac{t}{\tau_p}}$$ so $$v_A(t)=\frac{kT}{q}\ln\left[1+\left(e^{qV_{ON}/kT}-1\right)\operatorname{erf}\sqrt{\frac{t}{\tau_p}}\right]$$ Program modification (add inside the time loop after `yon` is computed; `yon(1)` is the `X=0` value): ```matlab VON = 0.5; Vth = 0.0259; ra = exp(VON/Vth)-1; % = IF/I0 = 2.42e8 T = 0.1:0.1:2; vA_exact = zeros(size(T)); for i = 1:length(T) A = exp(-X).*(1-erf(X./(2*sqrt(T(i)))-sqrt(T(i)))); B = exp( X).*(1-erf(X./(2*sqrt(T(i)))+sqrt(T(i)))); yon = (A-B)/2; vA_exact(i) = Vth*log(1 + ra*yon(1)); end vA_quasi = Vth*log(1 + ra*(1-exp(-T))); % Eq. 8.16 ``` **(b) Comparison** ($V_{ON}=0.5$ V, $T=300$ K, $I_F/I_0=e^{0.5/0.0259}-1=2.42\times10^8$): | $t/\tau_p$ | $\operatorname{erf}\sqrt{t/\tau_p}$ | $v_A$ exact (V) | $v_A$ Eq. 8.16 (V) | |---|---|---|---| | 0.1 | 0.345 | 0.4725 | 0.4391 | | 0.2 | 0.473 | 0.4806 | 0.4558 | | 0.3 | 0.561 | 0.4850 | 0.4650 | | 0.4 | 0.629 | 0.4880 | 0.4713 | | 0.5 | 0.683 | 0.4901 | 0.4758 | | 0.6 | 0.727 | 0.4917 | 0.4794 | | 0.7 | 0.763 | 0.4930 | 0.4822 | | 0.8 | 0.794 | 0.4940 | 0.4845 | | 0.9 | 0.820 | 0.4949 | 0.4865 | | 1.0 | 0.843 | 0.4956 | 0.4881 | | 1.2 | 0.879 | 0.4966 | 0.4907 | | 1.4 | 0.906 | 0.4974 | 0.4927 | | 1.6 | 0.926 | 0.4980 | 0.4942 | | 1.8 | 0.942 | 0.4985 | 0.4953 | | 2.0 | 0.955 | 0.4988 | 0.4962 | **Conclusion.** The quasistatic result (8.16) always **underestimates** the exact voltage: by about 33 mV (7% of $V_{ON}$) at $t=0.1\tau_p$, and by only 2.6 mV (0.5%) at $2\tau_p$. The real profile builds up faster near the edge than the quasistatic (steady-shaped) profile would, because charge has not yet spread into the bulk, and the edge concentration sets the voltage, so the exact voltage leads. The quasistatic formula captures the shape (fast rise, slow finish), and its error shrinks as time increases.